API Archives:

Check out API's archive of published papers, videos and articles that dive deeper into relevant concepts and technologies.

Published Papers
• An Effective Method of Probe-calibration in Phase Resolved Near-field Scanning for EMI Application

• A Measurement Technique for ESD Current Spreading on A PCB using Near Field Scanning

• Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz

• Application and Limits of IC and PCB Scanning Methods for Immunity Analysis

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Videos:
• SmartScan ESD Scanner Introduction

• Current Spreading, Part 1

• Current Spreading, Part 2

• Current Spreading, Part 3

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Published Articles:
• API's Standard EMI Probe Characterization

• API EMC Scan Technologies >

• Current Spreading TLP vs ESD Simulator

• Standard Practice in EMI Measurement on Shielding Effectiveness(SE) Evaluation Test v4.0

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